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TTTC's Electronic Broadcasting
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IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis |
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CALL FOR PAPERS AND PARTICIPATION
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THEME: “Data in the Product Lifecycle” In test, we use data every day. Yield data, throughput data, statistical data, reliability data, outlier data, general production data are all in everyday use. However, data means much more than that. Advances in our industry allow data from wafer fab to be reused in studying system level test results. Field failure studies now routinely uses wafer probe data to understand root cause. Data has now become a product life cycle requirement—cradle to grave. Today access to the data has become an issue; the control and sharing of data among business partners. How to efficiently process data to extract the golden nuggets of useful information amid the gigabytes of unimportant noise remains a focus and a challenge for test professionals. The Organizing Committee for the DATA-2017 Workshop is soliciting papers in: semiconductor test, yield analysis, product learning, and quality improvement. Of particular interest are advanced techniques and new tools for the use of data during the entire product life cycle, with special attention to how data can be used to change and alter test flows and decisions (adaptive test). Preference will be given to real-world case studies. Ideas or proposals for Embedded Tutorials, Debates, Panel Discussions and Poster style “Spot-Light” presentations describing industrial experiences or research are also invited. Suggested Topics
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To present at the workshop, send to Smith.Wesley@Siemens.com a PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format) by September 20, 2017. Each submission should include full name and address of each author, affiliation, telephone number, FAX and Email address. Camera-ready papers for inclusion in the digest of papers will be due on October 23, 2017. |
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Submission Date: September 20, 2017 Notification of Acceptance: October 2, 2017 Camera Ready Paper (.pdf): October 16, 2017 Final Presentation Slides (.ppt): October 23, 2017 |
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| Additional Information | |
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General Information: Jeffrey L Roehr Independent Test Consultant E-mail: JLRoehr@Gmail.com Technical Program Submissions: Wesley Smith Mentor, a Siemens Company E-mail: Smith.Wesley@Siemens.com |
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| Committee | |
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GENERAL CHAIR
PROGRAM CHAIR
FINANCE CHAIR
PUBLICITY & WEB CHAIR
PUBLICATIONS CHAIR
PANEL CHAIR
LOCAL ARRANGEMENTS
TEST STANDARDS CHAIR
EU LIAISON
STEERING COMMITTEE
PROGRAM COMMITTEE
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For more information, visit
us on the web at: http://DATA.tttc-events.org/
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DATA 2017 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE Computer Society-Test
Technology Technical Council
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